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CUSTOM UHV & SURFACE ANALYSIS DEVICES AND PARTS:

We can design and/or build almost any surface analysis or UHV part or device that you may need. We have many years of experience manufacturing precision instruments to the most demanding of specifications. Contact us to discuss your requirements.

NEW: IMPROVED APERTURE FOR PHI 06-650 ION COLUMN

This aperture and plate is used as the condenser steerer defining orifice in the ion column for the PHI 6300 and 6600 SIMS systems. The original PHI part used an aperture integral with the plate, and was made entirely of SST. This meant that it sputtered away quickly, enlarged the hole, and then sputtered material back onto the frit in the source and poisoned it. Our new plates hold a replaceable W aperture. We designed it so that existing PHI plates can be modified to hold the W aperture as well. Contact us for details. View aperture photograph.

NEW: NICKEL CATHODES FOR PHI SOURCES:

These work with the duoplasmatron ion source, PHI model 06-660.

COMING SOON: REPLACEMENT FILAMENTS FOR PHI ANALYZERS:

We will shortly offer replacement or rebuilt filaments for many PHI analyzers, equivalent to PHI part # C75010. This is the most common PHI filament, and was used in their CMA, HEED, etc. This filament is different from the LEED filament (# D71017) that we already supply.

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